Autotalks has used test expertise and equipment from Rohde & Schwarz to verify the performance of their third-generation V2X chipset.

At the recent Conformance Agreement Group (CAG) #77 meeting, Rohde & Schwarz has successfully verified the NTN NB-IoT test cases of work item 333 using its R&S CMW500 radio communication tester, allowing the Global Certification Forum (GCF) to activate the work item in their device certification program.

The metaverse and extended reality (XR) applications are considered critical to unlocking the full consumer potential of the 5G technology. Rigorous testing is crucial to ensure the performance and market acceptance of these immersive experiences.

As 5G technology evolves, non-3GPP networks such as public, home and enterprise WLAN hotspots will be more and more interlinked with the 5G core. As a result, tomorrow’s smartphones will rely even more on the next generations of WLAN technology, which will be more powerful and efficient, but also more complex.

Always at the forefront of technological innovation, Rohde & Schwarz is shaping the future of the mobile industry with its comprehensive range of test and measurement solutions.

The Demystifying EMC event, hosted by Rohde & Schwarz, is a one-day virtual conference on February 6, 2024, featuring expert sessions on EMC standards and practical tips from commercial and academic partners.

Rohde & Schwarz hosted the Mobile Test Summit, a platform for industry professionals to share insights on the latest trends in mobile device and infrastructure testing.

The Electronic Communications Office of Iceland (ECOI) has selected Rohde & Schwarz mobile network testing to assess and benchmark the performance, coverage and capacity of the country's three mobile network operators.

A new automated test solution is tailored for verification and mass production tests of wireless device tests. This development builds on existing efforts for wBMS RF robustness testing.

The radar target simulator R&S RTS, Rohde & Schwarz’ game-changing solution of automotive radar, in particular its ability to electronically simulate very close-range objects, has been used to verify the performance of NXP^® Semiconductors’ next-generation radar sensor reference design.